Quantitative KPFM Measurements on Silicon Nanowire Structures
Quantitative KPFM Measurements on Silicon Nanowire Structures
Baumgart, C.
Abstract
This workshop focus on the electrical characterization of vertical and horizontal Si nanowires.
Beteiligte Forschungsanlagen
- Ionenstrahlzentrum DOI: 10.17815/jlsrf-3-159
Verknüpfte Publikationen
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 14379) publication
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Sonstiger Vortrag
Workshop FZD/FZJ: Silicon Nanowire Structures, 29.04.2010, Dresden, Germany
Permalink: https://www.hzdr.de/publications/Publ-14379
