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3D vector magnetooptical ellipsometry investigations on magnetic thin film samples at room temperature

Mok, K. M.; Schmidt, H.

Abstract

We present the set-up of a vector-magneto-optical generalized ellipsometer (VMOGE) which allows to perform generalized Mueller matrix ellipsometry in a magnetic field of arbitrary orientation and magnitude up to 0.4 T at room temperature. Using VMOGE measurements, we measured the magneto-optical properties of the elemental ferromagnets Co, Fe, and Ni and extracted the wavelength dependence of the magneto-optical dielectric tensor under saturated magnetization conditions via model analysis.

Keywords: Magnetic semiconductors; spin poalrization; magnetooptical response

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    Halbleiterphysik-Seminar (AG Zahn), TU Chemnitz, 21.01.2011, Chemnitz, Germany

Permalink: https://www.hzdr.de/publications/Publ-15217