Microfocus infrared ellipsometry characterization of air-exposed graphene flakes

Graphene and ultrathin graphite flakes prepared by exfoliation were characterized by microfocus synchrotron infrared mapping ellipsometry. The dielectric function of graphene in a dry-air atmosphere is determined and compared to that of ultrathin graphite, bulk graphite and gold. The imaginary part of graphene was revealed to be about an order of magnitude higher than that of graphite. Comparing the conductivity to an optical model considering intraband transitions we discuss the effects of environmental exposure, relevant for real-world applications.