Ion beams as a tool for advanced structural characterization in ZnO-based materials
Ion beams as a tool for advanced structural characterization in ZnO-based materials
Redondo-Cubero, A.; Lorenz, K.; Alves, E.; Gago, R.; Hierro, A.; Vinnichenko, M.; Chauveau, J.-M.; Nakamura, A.; Krause, M.; Temmyo, J.; Muñoz, E.; Brandt, M.; Henneberger, F.
Abstract
This work shows the application of ion beam techiques to the structural characterization of different ZnO compounds. Taking advantage of ion channelling phenomena in combination with some specific nuclear resonances, the individual evaluation of defects in the IIb-metal and O sublattices is achieved.
Beteiligte Forschungsanlagen
- Ionenstrahlzentrum DOI: 10.17815/jlsrf-3-159
Verknüpfte Publikationen
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 16720) publication
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Eingeladener Vortrag (Konferenzbeitrag)
SPIE Photonics West, Optoelectronic Materials and Devices, Oxide-based Materials and Devices III (Conference 8263), 22.-25.01.2012, San Francisco, USA
Permalink: https://www.hzdr.de/publications/Publ-16720
