Study on a simulation-based scatter correction for high-resolution gamma-ray tomography
Study on a simulation-based scatter correction for high-resolution gamma-ray tomography
Hampel, U.; Wagner, M.; Bieberle, A.
Abstract
A simulation-based scatter correction algorithm is applied on CT data sets of mockup measurements acquired from the high-resolution gamma-ray tomography system of the Institute of Fluid Dynamics at Helmholtz-Zentrum Dresden-Rossendorf (HZDR). Based on the initially reconstructed image and on previous knowledge about the material distributions of the scanned object, a first-order scatter sinogram is simulated which allows a correction of the original data set. For two different mockups, the amount of the scatter and the shape of the imaging artifacts are analyzed.
Keywords: gamma-ray; computed tomography; scatter correction
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Beitrag zu Proceedings
7th World Congress on Industrial Process Tomography, WCIPT7, 02.09.-05.12.2013, Kraków, Poland
Proceedings of WCIPT7
Permalink: https://www.hzdr.de/publications/Publ-19483