The He ion microscope—a high resolution tool for the nano–world

The He ion microscope—a high resolution tool for the nano–world

Hlawacek, G.

Abstract

Invited presentation ANP retreat

Beteiligte Forschungsanlagen

Ionenstrahlzentrum DOI: 10.17815/jlsrf-3-159

Verknüpfte Publikationen

DOI: 10.17815/jlsrf-3-159 is cited by this (Id 21432) publication

Eingeladener Vortrag (Konferenzbeitrag)
ANP retreat, 19.-20.06.2014, Tecklenburg, Germany

Permalink: https://www.hzdr.de/publications/Publ-21432