X-ray studies of silicon wafers implanted with MeV Ge++ions
X-ray studies of silicon wafers implanted with MeV Ge++ions
Eichhorn, F.; Sass, J.; Mazur, K.
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Vortrag (Konferenzbeitrag)
4th Europ. Conf. on High Resolution X-ray Diffraction and Topography, Durham/GB, Sept. 9 - 12, 1998
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