Nanoscale Imaging of Antiferromagnetic Order using Single-spin Magnetometry
Nanoscale Imaging of Antiferromagnetic Order using Single-spin Magnetometry
Shields, B.; Appel, P.; Kosub, T.; Hedrich, N.; Fassbender, J.; Huebner, R.; Makarov, D.; Maletinsky, P.
Abstract
Nitrogen vacancy microscopy is used to detect tiny magnetic stray fields from antiferromagnetic Cr2O3 thin films. Domains and domain dynamics are reported.
Beteiligte Forschungsanlagen
- Ionenstrahlzentrum DOI: 10.17815/jlsrf-3-159
Verknüpfte Publikationen
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 28621) publication
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Poster
International Conference on Magnetism, 15.-20.7.2018, San Francisco, USA
Permalink: https://www.hzdr.de/publications/Publ-28621
