XPS investigations for the study of Ge clustering in SiO2
XPS investigations for the study of Ge clustering in SiO2
Ostwald, S.; Schmidt, B.; Heinig, K.-H.
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Vortrag (Konferenzbeitrag)
8th European Conf. on Appl. of Surface and Interface Analysis (ECASIA´99), Sevilla, Spain, October 4-8, 1999
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