Influence of polytypism on elementary processes of ion-beam-induced defect production in SiC
Influence of polytypism on elementary processes of ion-beam-induced defect production in SiC
Posselt, M.; Belko, V.; Chagarov, E.
Abstract
Informations can be requested. Email: M.Posselt@fz-rossendorf.de
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Vortrag (Konferenzbeitrag)
International Workshop of the European Network on Defect Engineering of Advanced Semiconductor Devices, Kista-Stockholm, Sweden, June 27-29, 2000 -
Vortrag (Konferenzbeitrag)
5th International Conference on Computer Simulation of Radiation Effects in Solids, Penn State University, State College, USA, July 24-28, 2000
Permalink: https://www.hzdr.de/publications/Publ-3444