Nonlinear response of semiconductor under intense THz excitation
Nonlinear response of semiconductor under intense THz excitation
Abstract
Intense narrowband terahertz pulses from the FELBE free-electron laser facility and a complementary table-top high-field THz source are utilized to study nonlinear excitation regimes in semiconductors. In this talk we present several recent examples including impurities transitions in boron doped Si, HgTe topological quantum wells and plasmons in individual InGaAs nanowires.
Beteiligte Forschungsanlagen
- Strahlungsquelle ELBE DOI: 10.17815/jlsrf-2-58
- F-ELBE
Verknüpfte Publikationen
- DOI: 10.17815/jlsrf-2-58 is cited by this (Id 38069) publication
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Eingeladener Vortrag (Konferenzbeitrag)
Joint ELI Workshop on Advanced Technologies, 04.-06.12.2023, Szeged, Hungary
Permalink: https://www.hzdr.de/publications/Publ-38069