Positron annihilation spectroscopy studies of the SiO2/Si interface
Positron annihilation spectroscopy studies of the SiO2/Si interface
Brauer, G.
Abstract
no abstract delivered from author
Keywords: kein
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Sonstiger Vortrag
Department of Low-Temperature Physics, Charles University Prague, Prague, 28.05.2002
Permalink: https://www.hzdr.de/publications/Publ-4784