The (224) asymmetrical reflection from laterally patterned heteroepitaxial inGaAs/GaAs layers
The (224) asymmetrical reflection from laterally patterned heteroepitaxial inGaAs/GaAs layers
Mazur, K.; Sass, J.; Eichhorn, F.; Strupinski, W.; Turos, A.; Kowalik, A.
Abstract
Kein Abstract vorhanden.
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Vortrag (Konferenzbeitrag)
Int. Conf. on Experimental and Computing Methods in High Resolution Diffraction Applied for Structure Characterization of Modern Materials, 13.-17.06.2004, Zakopane, Poland
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