Characterisation of thin films using ion beams
Characterisation of thin films using ion beams
Munnik, F.
Abstract
Introduction to Ion Beam Materials Analysis (IBA)
Characterisation of thin films by Ion Beam Materials Analysis (IBA)
Research topics for Ion Beam Materials Analysis (IBA)
Keywords: Ion Beam Analysis
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Sonstiger Vortrag
Materials Science Workshop II, 23.-25.03.2009, Sohag, Ägypten
Permalink: https://www.hzdr.de/publications/Publ-12926
