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In Situ Characterization of Alloy Catalysts for Low-Temperature Graphene Growth

Weatherup, R. S.; Bayer, B. C.; Blume, R.; Ducati, C.; Baehtz, C.; Schlögl, R.; Hofmann, S.

Abstract

Low-temperature (∼450 °C), scalable chemical vapor deposition of predominantly monolayer (74%) graphene films with an average D/G peak ratio of 0.24 and domain sizes in excess of 220 μm2 is demonstrated via the design of alloy catalysts. The admixture of Au to polycrystalline Ni allows a controlled decrease in graphene nucleation density, highlighting the role of step edges. In situ, time-, and depthresolved X-ray photoelectron spectroscopy and X-ray diffraction reveal the role of subsurface C species and allow a coherent model for graphene formation to be devised.

Keywords: Graphene; chemical vapor deposition (CVD); alloy catalyst; in situ metrology; XPS; XRD

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Permalink: https://www.hzdr.de/publications/Publ-16363