Probing origin of room temperature ferromagnetism in Ni ion implanted ZnO films with x-ray absorption spectroscop
Probing origin of room temperature ferromagnetism in Ni ion implanted ZnO films with x-ray absorption spectroscop
Srivastava, P.; Ghosh, S.; Joshi, B.; Satyarthi, P.; Kumar, P.; Kanjilal, D.; Buerger, D.; Zhou, S.; Schmidt, H.; Rogalev, A.; Wilhelm, F.
Abstract
We report x-ray absorption at Zn and Ni K-edges in 200 keV Ni(2+) ion implanted ZnO/sapphire films. The implantation fluences are 6 x 10(15) and 2 x 10(16) ions/cm(2), corresponding to 2% and 7% Ni in a ZnO matrix. The measurements reveal a marginal substitution of Ni in ZnO in both the films and also rule out the presence of ferromagnetic Ni metal clusters. The M-H and field cooled-zero field cooled measurements performed via SQUID magnetometry show that the films are ferromagnetic at room temperature, and the saturation magnetization of 2% Ni film is appreciably higher than that of 7% Ni film. The origin of ferromagnetism is understood on the basis of the oxygen vacancy mediated bound magnetic polaron model.
Beteiligte Forschungsanlagen
- Ionenstrahlzentrum DOI: 10.17815/jlsrf-3-159
Verknüpfte Publikationen
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 16815) publication
-
Journal of Applied Physics 111(2012), 013715
DOI: 10.1063/1.3676260
Cited 22 times in Scopus
Permalink: https://www.hzdr.de/publications/Publ-16815