Thermal Effect on Electroluminescence Quenching in SiO2 with Ge and ReOX Nanoclusters
Thermal Effect on Electroluminescence Quenching in SiO2 with Ge and ReOX Nanoclusters
Tiagulskyi, S. I.; Tyagulskiy, I. P.; Nazarov, А. N.; Nazarova, T. M.; Rymarenko, N. L.; Lysenko, V. S.; Rebohle, L.; Lehmann, J.; Skorupa, W.
Abstract
Thermal quenching and thermal dependences of the electrical quenching of electroluminescence in metal-oxide-silicon lightemitting devices implanted by Ge and Tb ions containing Ge and TbOx nanoclusters after annealing are studied. Light thermal quenching of the main green line (541 nm) in the EL spectrum of Tb implanted structures is observed. The strong temperature dependence of the electrical quenching of EL both for Ge and Tb implanted structures is explained by the participation of mobile ions in negative and positive charge generation in the bulk of SiO2 and near the SiO2-Si interface, correspondingly.
Keywords: MOSLEDs; rare earth implanted oxide; electroluminescence; charge trapping; clustering
Involved research facilities
- Ion Beam Center DOI: 10.17815/jlsrf-3-159
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- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 17249) publication
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ECS Transactions 45(2012)5, 161-166
DOI: 10.1149/1.3700423
Permalink: https://www.hzdr.de/publications/Publ-17249