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Ion source memory in 36Cl accelerator mass spectrometry

Pavetich, S.; Akhmadaliev, S.; Arnold, M.; Aumaître, G.; Bourlès, D.; Buchriegler, J.; Golser, R.; Keddadouche, K.; Martschini, M.; Merchel, S.; Rugel, G.; Steier, P.

Abstract

Since the DREAMS (Dresden Accelerator Mass Spectrometry) facility went operational in 2011, constant effort was put into enabling routine measurements of long-lived radionuclides as 10Be, 26Al and 41Ca. For precise AMS-measurements of the volatile element Cl the key issue is the minimization of the long term memory effect [1]. For this purpose one of the two original HVE sources was mechanically modified, allowing the usage of bigger cathodes with individual target apertures. Additionally a more open geometry was used to improve the vacuum level. To evaluate this improvement in comparison to other up-to-date ion sources, a small interlaboratory comparison had been initiated.
The long-term memory effect in the Cs sputter ion sources of the AMS facilities VERA, ASTER and DREAMS had been investigated by running samples of natural 35Cl/37Cl-ratio and samples containing highly enriched 35Cl (35Cl/37Cl > 500). Primary goals of the research are the time constants of the recovery from the contaminated sample ratio to the initial ratio of the sample and the level of the long-term memory effect in the sources.
[1] R. Finkel et al., NIMB 294 (2013) 121.

Keywords: accelerator mass spectrometry; DREAMS; 36Cl; long-term-memory-effect; ion source; volatile elements

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Permalink: https://www.hzdr.de/publications/Publ-18138