Nanostructures by mass-separated FIB


Nanostructures by mass-separated FIB

Bischoff, L.; Böttger, R.; Philipp, P.; Schmidt, B.

Abstract

The introduction of mass-separated systems in the field of focused ion beams significantly increases the area of application in nanotechnology due to the availability of a broad spectrum of ions with the same advantages compared to classical Ga instruments. A short description of the configuration of a mass-separated FIB tool is given as well as the fundamentals of alloy liquid metal ion sources. Examples of application include patterned tailoring of functional surfaces and ion-induced phase transformation in thin layers, in particular the Si nanowire fabrication by FIB implantation and subsequent wet-chemical, anisotropic etching and the FIB lithography of thin ta-C films. Furthermore, the ion beam synthesis of CoSi2 nanostructures by Co-FIB writing and annealing, and the modification of surface morphology by various mono- and polyatomic projectiles in a broad energy- and temperature range in different materials are described and discussed.

Keywords: mass-separated focused ion beam; alloy liquid metal ion source; ExB filter; Si nanowire; ion beam synthesis; CoSi2 nanostructures; ta-C films; self-organized surface morphology; polyatomic ions

Beteiligte Forschungsanlagen

Verknüpfte Publikationen

  • Buchkapitel
    Zhiming Wang: “FIB Nanostructures” Springer Series in Materials Science Lecture Notes on Nanoscale Science and Technology, Peking, Berlin: Springer, 2013, 978-3-319-02874-3

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