Thin layer analysis with electrons - AES, XPS, Mössbauer spectroscopy
Thin layer analysis with electrons - AES, XPS, Mössbauer spectroscopy
Reuther, H.
Abstract
Thin surface layers on a solid may refine properties like corrosion, friction or wear of the whole workpiece. There are a lot of methods for modification and the analysis of such layers is often based on different kinds of electron spectroscopy.
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Eingeladener Vortrag (Konferenzbeitrag)
XXXIV Brazilian Congress of Vacuum Applications in Industry and Science, 21.-25.10.2013, Ilheus, Brasilien
Permalink: https://www.hzdr.de/publications/Publ-19594