Thin layer analysis with electrons - AES, XPS, Mössbauer spectroscopy


Thin layer analysis with electrons - AES, XPS, Mössbauer spectroscopy

Reuther, H.

Abstract

Thin surface layers on a solid may refine properties like corrosion, friction or wear of the whole workpiece. There are a lot of methods for modification and the analysis of such layers is often based on different kinds of electron spectroscopy.

  • Eingeladener Vortrag (Konferenzbeitrag)
    XXXIV Brazilian Congress of Vacuum Applications in Industry and Science, 21.-25.10.2013, Ilheus, Brasilien

Permalink: https://www.hzdr.de/publications/Publ-19594