The He ion microscope—a high resolution tool for the nano–world
The He ion microscope—a high resolution tool for the nano–world
Hlawacek, G.
Abstract
Invited presentation ANP retreat
Beteiligte Forschungsanlagen
- Ionenstrahlzentrum DOI: 10.17815/jlsrf-3-159
Verknüpfte Publikationen
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 21432) publication
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Eingeladener Vortrag (Konferenzbeitrag)
ANP retreat, 19.-20.06.2014, Tecklenburg, Germany
Permalink: https://www.hzdr.de/publications/Publ-21432