A simple method for deadtime corrections in microbeam measurements.

In microbeam measurements on inhomogeneous samples large variations in count-rate can occur. These variations result in variations in deadtime that have to be used to correct elemental distribution maps. However, the deadtime is usually not available on a pixel by pixel basis. In this work, a simple model is proposed to calculate the deadtime for each pixel. Measurements to determine the deadtime per event, needed in the model, are presented and the deadtime corrections are presented for real samples.