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Correlation of electrical and structural properties of single as-grown GaAs nanowires on Si (111) substrates

Bussone, G.; Schäfer-Eberwein, H.; Dimakis, E.; Biermanns, A.; Carbone, D.; Tahraoui, A.; Geelhaar, L.; Haring Bolívar, P.; Schülli, T. U.; Pietsch, U.

Abstract

We present the results of the study of the correlation between the electrical and structural properties of individual GaAs nanowires measured in their as-grown geometry. The resistance and the effective charge carrier mobility were extracted for several nanowires, and subsequently, the same nano-objects were investigated using X-ray nanodiffraction. This revealed a number of perfectly stacked zincblende and twinned zincblende units separated by axial interfaces. Our results suggest a correlation between the electrical parameters and the number of intrinsic interfaces.

Keywords: single GaAs nanowires; electrical characterization; X-ray nanodiffraction; correlation; plastic deformation; axial interfaces

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Permalink: https://www.hzdr.de/publications/Publ-22931