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Energy filter for tailoring depth profiles in semiconductor doping application

Csato, C.; Krippendorf, F.; Akhmadaliev, S.; von Borany, J.; Han, W.; Siefke, T.; Zowalla, A.; Rüb, M.

Abstract

This work presents the physics and technology of a micromechanically fabricated ‘‘energy filter’’ for doping applications. This energy filter is capable of producing pre-defined tailored doping profiles by a single monoenergetic ion implantation. The functional principle of the energy filter is explained using a simple model. Pattern transfer is being investigated for two different filter-substrate distances. Different aspects of the filter’s temperature behavior during irradiation are discussed. Finally, the results of an entire wafer area implantation are presented and discussed.

Keywords: Implantation; Ion; Energy filter; Silicon carbide; Doping homogeneity

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Permalink: https://www.hzdr.de/publications/Publ-22965