Atomistic modeling of ion implantation within a 2d process simulator
Atomistic modeling of ion implantation within a 2d process simulator
Schmidt, B.; Posselt, M.; Strecker, N.; Feudel, T.
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Vortrag (Konferenzbeitrag)
MRS Fall Meeting, Boston, USA, Dec. 1 - 5, 1997 -
Beitrag zu fremdem Sammelwerk
Mat. Res. Soc. Symp. Proc. 490 (1998) 21
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