Electrical characterization of atomically thin InSe layers

Two-dimensional (2D) materials have gained enormous attention in recent years owing to their huge potential in future electronics and optics. On the one hand, conventional 2D materials like graphene, MoS2, h-BN are being intensively studied, on the other hand, search for novel 2D materials is at a rapid pace. In this study, we have investigated electrical properties of 2D nanosheets of ultrathin Indium Selenide (InSe), a member of the family of III-VI chalcogenides. The InSe layers were prepared via micromechanical cleavage of its bulk crystal and were integrated into a field-effect transistor (FET) device as the transport channel. On characterizing the InSe-based FET, InSe showed n-type conductance with the mobility of 2.1x10-4 cm2V-1s-1.