Publikationsrepositorium - Helmholtz-Zentrum Dresden-Rossendorf

Evidence for a spin reorientation in antiferromagnetic (AFM) Mn₂Au thin films induced by high magnetic fields as well as by the application of in-plane mechanical stress is provided. The AFM domain population in the samples was investigated by resonant X-ray Magnetic Linear Dichroism (XMLD) measurements at the L₃ edge of Mn using a variable linear polarization of the incident photon beam. As grown samples show no XMLD signal due to averaging over a random AFM domain distribution. After the exposure to a 70 T in-plane magnetic field a clear XMLD signal indicating the generation of a preferential AFM domain orientation is obtained. The same type of XMLD signal is observed when the thin films are strained, demonstrating the feasibility of AFM Domain manipulation by magnetic fields and stress in Mn₂Au.