A versatile ion beam spectrometer for studies of ion interaction with 2D materials
A versatile ion beam spectrometer for studies of ion interaction with 2D materials
Schwestka, J.; Melinc, D.; Heller, R.; Niggas, A.; Leonhartsberger, L.; Winter, H.; Facsko, S.; Aumayr, F.; Wilhelm, R. A.
Abstract
We present an ultra-high vacuum setup for ion spectroscopy of freestanding two-dimensional solid targets. An ion beam of different ion species (e.g. Xe with charge states from 1 to 44 and Ar with charge states from 1 to 18) and kinetic energies ranging from a few 10 eV to 400 keV is produced in an electron beam ion source. Ions are detected after their transmission through the 2D target with a position sensitive microchannel plate detector allowing the determination of the ions exit charge state as well as the scattering angle with a resolution of approx. 0.04◦. Further, the spectrometer is mounted on a swiveling frame covering a scattering angle of ±8° with respect to the incoming beam direction. By utilizing a beam chopper we measure the time-of-flight of the projectiles and determine the energy loss when passing a 2D target with an energy uncertainty of about 2%. Additional detectors are mounted close to the target to observe emitted secondary particles and are read-out in coincidence with the position and time information of the ion detector. A signal in these detectors can also be used as a start trigger for time-of-flight measurements, which then yield an energy resolution of 1% and an approx. 1000-fold larger duty cycle. First results on the interaction of slow Xe30+ ions with a freestanding single layer of graphene obtained with the new setup are compared to recently published data where charge exchange and energy were measured by means of an electrostatic analyzer.
Keywords: slow highly charged ions; 2D materials; ion spectrometer; single layer graphene
Beteiligte Forschungsanlagen
- Ionenstrahlzentrum DOI: 10.17815/jlsrf-3-159
Verknüpfte Publikationen
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 27743) publication
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Review of Scientific Instruments 89(2018)8, 085101
DOI: 10.1063/1.5037798
Cited 16 times in Scopus
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