High energy ion beams as a powerful tool for the analysis of the elemental composition of thin layers
High energy ion beams as a powerful tool for the analysis of the elemental composition of thin layers
Keywords: Ion Beam Analysis
Beteiligte Forschungsanlagen
- Ionenstrahlzentrum DOI: 10.17815/jlsrf-3-159
Verknüpfte Publikationen
- DOI: 10.17815/jlsrf-3-159 is cited by this (Id 30076) publication
-
Sonstiger Vortrag
Kolloquium am Ferdinand-Braun-Institut, Berlin, 29.11.2019, Berlin, Germany
Permalink: https://www.hzdr.de/publications/Publ-30076