In-situ X-ray diffraction during sputtering of Shape Memory Alloy (SMA) Ni-Ti thin films
In-situ X-ray diffraction during sputtering of Shape Memory Alloy (SMA) Ni-Ti thin films
Martins, R. M. S.; Braz Fernandes, F. M.; Silva, R. J. C.; Schell, N.
Abstract
Kein Abstract vorhanden.
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Vortrag (Konferenzbeitrag)
DPG-Frühjahrstagung, 08.-12.03.2004, Regensburg, Germany
Permalink: https://www.hzdr.de/publications/Publ-9800